AFM-T

AFM-T Teaching-Oriented Atomic Force Microscope

USB2.0/3.0, portable and convenient, suit for teaching field

Core Features

Configurations

Sample movement

0~13mm

Sample Size

Φ≤90mm，H≤20mm

Resolution

X/Y: 0.2 nm, Z: 0.05nm

Scan angle

0~360°

Compact and detachable design ,portable and suit for teaching
Scan head and sample scanning stage are designed together, strong anti-vibration performance
Precision laser detection and probe alignment device make laser adjustment simple and easy
Sample approaches the probe vertically automatically with single axle drive, locating the scanned area accurately, and making the tip perpendicular to the sample scanning
Intelligent injection mode for automatic detection of pressurized electrical ceramics controlled by motor, for protecting the probe and sample
Optical position, 4X Objective without focusing for real-time observation and locating scanning area of probe sample
Adopt spring for vibration isolation, simple and good performance
Integrated scanner hardware nonlinear correction user editor, nano-characterization and measurement accuracy is better than 98%

Specification for AFM-T
Basic Operation Modes	Tapping mode, RMS-Z curve measurement
Optional Operation Modes	Contact mode, F-Z curve measurement, Friction/Lateral, Amplitude/Phase, Magnetic/ Electrostatic
Sample Size	Φ≤90mm，H≤20mm
Max. Scan Range	XY:20μm, Z: 2μm
Resolution	X/Y: 0.2 nm, Z: 0.05nm
Sample movement	0~13mm
Optical Mag.	4X
Optical Resolution	2.5μm
Scan rate	0.6Hz~4.34Hz
Scan angle	0~360°
Scanning control	XY: 18-bit D/A, Z: 16-bit D/A
Data sampling	One 14-bit A/D and double 16-bit A/D multiple-channel simultaneously
Feedback Mode	DSP digital feedback
Feedback sampling rate	64.0KHz
Interface	USB2.0/3.0
Operation Environment	Compatible with WindowsXP/7/8/10

Application for AFM-T
Material Science		Observation and research of material surface, including surface roughness, surface structure, particle size, defects etc. metal and alloy, thin film, liquid crystal, crystal, superconductor etc.
Micro-electronics		Automatic on-line detection of LSI, study the local electrical characteristics of IC. It is also used in the ultra-high density information storage and retrieval research.
Biology		DNA, Chromatin structure, Protein/Protease enzyme Reaction, Protein adsorption, Biological macromolecules react to cell surface antigens and intracellular proteins, the movement and morphology of cells, the unraveling of chromosome binding.
Medical Science		A powerful means of mesoscopic manipulation, including drugs, pharmacology, immunology, diagnosis and treatment etc.
Optics		Integrate optical technology with AFM technology to form a brand-new subject: near-field optics. It is a combination of super resolution in AFM’s san apperance and the merits of optical scanning.
Physics		Scan the surface electron structures, energy levels, wave functions etc. Mesoscopic physics can be carried out.
Chemistry		AFM is an effective in situ detection tool, study the surface chemical reactions at the atomic level, meanwhile detect the change of atomic in surface chemical reaction.