Microscope X / Scanning Probe Microscopes / AFM-R
Atomic Force Microscope Scanning Probe Microscope

AFM-R

AFM-R All-In-One Raman Atomic Force Microscope

USB2.0/3.0, 10X apochromatic objective, Raman Spectrometer

Core Features
  • Built-in 10X apochromatic objective
  • Precision laser detection
  • Probe alignment device
  • Motor controls Intelligent injection mode
  • Spring for vibration isolation
  • Built-in high-precision temperature-humidity sensor
Configurations
Sample Size
Φ≤90mm, H≤20mm
Optical Mag.
10X(Optional: 20X)
Resolution
X/Y: 0.2 nm, Z: 0.05nm
Feedback sampling rate
64.0KHz
USB2.0/3.0
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AFM-R
  • Integrated Raman Spectrometer with Atomic Force Microscope’s functions simultaneously, you can observe the 3-D morphology of sample while analyze the material composition
  • Built-in 10X apochromatic objective without focusing for viewing probe tip and Raman laser spot
  • Collecting the AFM and Raman data from the same point without moving the sample, in-situ detecting the morphology and chemical information of the sample
  • Scan head, laser coupler and sample scanning stage are designed together, strong anti-vibration stable performance
  • Precision laser detection and probe alignment device make laser adjustment simple and easy
  • Sample approaches the probe vertically automatically with single axle drive, locating the scanned area accurately, and making the tip perpendicular to the sample scanning
  • Intelligent injection mode for automatic detection of pressurized electrical ceramics controlled by motor, for protecting the probe and sample
  • Adopt spring for vibration isolation, simple and good performance
  • Metal soundproof and built-in high-precision temperature-humidity sensor for real-time monitoring of working environment
  • Integrated scanner hardware nonlinear correction user editor, nano-characterization and measurement accuracy is better than 98%

AFM-R