AFM-O All-In-One Compound Optical Atomic Force Microscope with CCD Camera & Display

AFM-O

USB2.0/3.0, Eyepiece & Objective, 11.6 inch Flat-panel display

Core Features

Configurations

Resolution

X/Y: 0.2 nm, Z: 0.05nm

Scan angle

0~360°

Photoelectricity control integration

USB2.0/3.0

3MP CCD Camera

All-In-One design, photoelectricity control integration
Both optical scan imaging and atomic force microscope’s scan imaging can be operated simultaneously
Equipped with optical 2-D measurement and atomic force microscope’s 3-D measurement simultaneously
Designed with vertical light path which is combined with gas-liquid probe rack
High-magnification optical position for precise location of probe and scan area
Convenient laser spot adjustment mode, you can operate real-time observation and spot adjustment through optical CCD window
Sample approaches the probe vertically automatically with single axle drive, locating the scanned area accurately, and making the tip perpendicular to the sample scanning
Intelligent injection mode for automatic detection of pressurized electrical ceramics controlled by motor, for protecting the probe and sample
Equipped with pneumatic shock absorber, strong anti-interference ability
Integrated scanner hardware nonlinear correction user editor, nano-characterization and measurement accuracy is better than 98%

Specification for AFM-O
Basic Operation Modes	Contact mode, Tapping mode, F-Z curve measurement, RMS-Z curve measurement, Friction/Lateral, Amplitude/Phase, Magnetic/ Electrostatic
Sample Size	Φ≤90mm，H≤20mm
Max. Scan Range	XY:20μm, Z: 2μm (Optional: XY: 50μm, Z:5μm
Resolution	X/Y: 0.2 nm, Z: 0.05nm
Sample movement	0~20mm
Optical Objective	5X，10X，20X，50X (Plan Apochromatic)
Optical Eyepiece	10X
CCD Sensor	3MP
Display	11.6 inch Flat-panel display with measuring function
Focusing Mode	Electrical Focusing
Scan rate	0.6Hz~4.34Hz
Scan angle	0~360°
Scanning control	XY: 18-bit D/A, Z: 16-bit D/A
Data sampling	One 14-bit A/D and double 16-bit A/D multiple-channel simultaneously
Feedback Mode	DSP digital feedback
Feedback sampling rate	64.0KHz
Interface	USB2.0/3.0
Operation Environment	Compatible with WindowsXP/7/8/10

Application for AFM-O
Material Science		Observation and research of material surface, including surface roughness, surface structure, particle size, defects etc. metal and alloy, thin film, liquid crystal, crystal, superconductor etc.
Micro-electronics		Automatic on-line detection of LSI, study the local electrical characteristics of IC. It is also used in the ultra-high density information storage and retrieval research.
Biology		DNA, Chromatin structure, Protein/Protease enzyme Reaction, Protein adsorption, Biological macromolecules react to cell surface antigens and intracellular proteins, the movement and morphology of cells, the unraveling of chromosome binding.
Medical Science		A powerful means of mesoscopic manipulation, including drugs, pharmacology, immunology, diagnosis and treatment etc.
Optics		Integrate optical technology with AFM technology to form a brand-new subject: near-field optics. It is a combination of super resolution in AFM’s san apperance and the merits of optical scanning.
Physics		Scan the surface electron structures, energy levels, wave functions etc. Mesoscopic physics can be carried out.
Chemistry		AFM is an effective in situ detection tool, study the surface chemical reactions at the atomic level, meanwhile detect the change of atomic in surface chemical reaction.